In this work, we aimed to
deposit PbS thin films at relatively low temperature and therefore thin films
were deposited onto preheated glass substrates at 473 K and 523 K by
ultrasonically spraying of equimolar aqueous solution of lead acetate and
thiourea. The thickness of deposited thin films was determined by spectroscopic
ellipsometry (SE) prior to investigate physical properties of deposited PbS
films. In order to investigate structural and morphological properties of PbS
thin films, x-ray diffraction (XRD) patterns and Atomic Force Microscopy (AFM)
images were obtained. Crystal structure, mean crystallite size, lattice
parameters, micro-strain of deposited thin films were evaluated by means of XRD
patterns and it was seen that deposited PbS thin films were successfully
obtained in polycrystalline form with cubic crystal structure. Also lattice
parameter of a was calculated as 5.866 Å
and 5.870 Å for thin films deposited at 473 K and 523 K, respectively.
Additionally, the surface roughness of PbS thin films was determined via AFM
images as 5.8 nm and 9.9 nm in non-contact mode. The obtained results confirm
that deposition of PbS thin films can be successfully achieved at relatively
low temperature.
Primary Language | English |
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Subjects | Engineering |
Journal Section | Research Articles |
Authors | |
Publication Date | December 31, 2019 |
Published in Issue | Year 2019 |
The works published in Journal of Innovative Science and Engineering (JISE) are licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.